Radiation apparatus and method for analysis of analytes in sample
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United States of America Patent
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Sep 12, 2000
Grant Date -
N/A
app pub date -
Feb 26, 1998
filing date -
Dec 4, 1997
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Abstract
A technique that uses wavelet analysis to analyze the concentration of an analyte in a sample. The technique includes irradiating the sample with electromagnetic radiation and detecting a resulting radiation from the sample to obtain spectral data. The electromagnetic radiation irradiated on the sample results in radiation interaction, such as reflection, scattering, and transmission, from the sample. The radiation interaction results in a resultant electromagnetic radiation from the sample, such as reflected radiation, scattered radiation, or transmitted radiation. The resultant electromagnetic radiation includes signals indicative of the analyte. The spectral data is digitally processed using wavelet analysis to increase proportionally the signal indicative of the analyte in the data. A modeling algorithm is applied to the processed data to determine the quantitative characteristics of the analyte in the sample.
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