Apparatus for testing an integrated circuit in an oven during burn-in
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United States of America Patent
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-
Oct 3, 2000
Issued Date -
N/A
app pub date -
Aug 4, 1998
filing date -
Apr 3, 1996
priority date (Note) -
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status (Latency Note)
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Abstract
An apparatus for testing an integrated circuit in an oven during burn-in. A burn-in board in the oven is electrically connected to a plurality of integrated circuit ('IC') components. A driver/interface board outside the oven is electrically connected to the burn-in board through a plurality of contacts and sends and receives a plurality of signals between the IC components and a test controller. A switch module on the burn-in board comprises a plurality of high-temperature switches for transferring signals between the plurality of IC components and the driver/interface board during burn-in. A plurality of signals entering the switch module from the driver/interface board does not exceed in number the plurality of contacts, and is fewer in number than a plurality of signals exiting the switch module to the plurality of IC components.
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