Nanometer-scale microscopy probes
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United States of America Patent
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Dec 12, 2000
Grant Date -
N/A
app pub date -
Jun 4, 1999
filing date -
Jun 5, 1998
priority date (Note) -
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Abstract
A carbon-based tip for scanning probe microscopy. The tip used in microscopy to reveal chemical characteristics of a sample includes a structure of the formula: X--(L--M).sub.n in which n is 1 to 100, X is a carbon-based nanotube, L is a linking group bonded at an end of the carbon-based nanotube, and M is a molecular probe bonded to the linking group.
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