Impedance-matched interconnection device for connecting a vertical-pin integrated circuit probing device to integrated circuit test equipment

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 6160412
SERIAL NO

09186084

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

An interconnection device used with test probe equipment for connecting a vertical-pin integrated circuit probing device to external test equipment. The interconnection device comprises a probe card with a pattern of contacts, a mounting plate adjustably mounted to the probe card and a space transformer member attached to both the mounting plate and the probe card. The space transformer carries traces which connect a small pattern of pins on the probing device with a larger pattern of conductors on the probe card. The space transformer is a laminated impedance-matching member comprising two layers of beryllium copper separated by a thin dielectric adhesive.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddressTotal Patents
WINWAY TECH. CO., LTD.KAOHSIUNG CITY, TW19

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Martel, Anthony Paul New Fairfield, CT 2 90
McQuade, Francis T Watertown, CT 13 281

Cited Art Landscape

Patent Info (Count) # Cites Year
 
WENTWORTH LABORATORIES, INC. (1)
* 4975638 Test probe assembly for testing integrated circuit devices 155 1989
 
BELL TELEPHONE LABORATORIES, INCORPORATED (1)
* 4901013 Apparatus having a buckling beam probe assembly 51 1988
 
TOKYO ELECTRON LIMITED (1)
* 5635846 Test probe having elongated conductor embedded in an elostomeric material which is mounted on a space transformer 199 1993
 
WINWAY TECH. CO., LTD. (1)
* 5416429 Probe assembly for testing integrated circuits 90 1994
* Cited By Examiner

Patent Citation Ranking

Forward Cite Landscape

Patent Info (Count) # Cites Year
 
INTERNATIONAL BUSINESS MACHINES CORPORATION (1)
6441632 Spring probe contactor for testing PGA devices 2 2001
 
DSL Labs, Incorporated (3)
8264248 Micro probe assembly 1 2007
* 2008/0238,408 Micro probe assembly 2 2007
* 2008/0238,452 Vertical micro probes 3 2007
 
3M INNOVATIVE PROPERTIES COMPANY (2)
* 6447328 Method and apparatus for retaining a spring probe 16 2001
6902416 High density probe device 75 2002
 
INTEST CORPORATION (2)
7141993 Interface apparatus for integrated circuit testing 0 2002
* 2004/0150,490 Interface apparatus for integrated circuit testing 2 2003
 
FormFactor, Inc. (37)
6483328 Probe card for probing wafers with raised contact elements 71 1998
7396236 Wafer level interposer 10 2001
6856150 Probe card with coplanar daughter card 87 2001
6729019 Method of manufacturing a probe card 111 2001
6816031 Adjustable delay transmission line 73 2001
* 6864105 Method of manufacturing a probe card 70 2002
* 2003/0025,172 Method of manufacturing a probe card 4 2002
7195503 Electrical contactor, especially wafer level contactor, using fluid pressure 7 2002
7122760 Using electric discharge machining to manufacture probes 2 2002
* 2004/0099,641 Probe array and method of its manufacture 0 2002
6945827 Microelectronic contact structure 51 2002
* 2004/0121,627 Microelectronic contact structure 2 2002
7168162 Method of manufacturing a probe card 5 2004
7262611 Apparatuses and methods for planarizing a semiconductor contactor 12 2004
* 2004/0266,089 Methods for planarizing a semiconductor contactor 3 2004
7057474 Adjustable delay transmission lines 7 2004
7116119 Probe card with coplanar daughter card 24 2005
* 2005/0140,381 Probe card with coplanar daughter card 0 2005
7196531 Method of manufacturing a probe card 11 2005
* 2005/0146,339 Method of manufacturing a probe card 1 2005
7731546 Microelectronic contact structure 5 2005
* 2007/0270,041 Microelectronic contact structure 2 2005
7239220 Adjustable delay transmission line 1 2006
7488917 Electric discharge machining of a probe array 0 2006
* 2007/0062,913 Probe Array and Method of Its Manufacture 0 2006
7455540 Electrical contactor, especially wafer level contactor, using fluid pressure 3 2007
7400157 Composite wiring structure having a wiring block and an insulating layer with electrical connections to probes 4 2007
7683738 Adjustable delay transmission line 0 2007
* 2007/0279,151 Adjustable Delay Transmission Line 4 2007
7737709 Methods for planarizing a semiconductor contactor 2 2007
7649368 Wafer level interposer 1 2008
7948252 Multilayered probe card 8 2008
7722371 Electrical contactor, especially wafer level contactor, using fluid pressure 0 2008
* 2009/0139,965 PROBE ARRAY AND METHOD OF ITS MANUFACTURE 2 2009
8373428 Probe card assembly and kit, and methods of making same 47 2009
7967621 Electrical contactor, especially wafer level contactor, using fluid pressure 1 2010
8427183 Probe card assembly having an actuator for bending the probe substrate 4 2011
 
CASCADE MICROTECH, INC. (21)
7355420 Membrane probing system 7 2002
7178236 Method for constructing a membrane probe using a depression 9 2003
7761986 Membrane probing method using improved contact 4 2003
7400155 Membrane probing system 2 2004
7266889 Membrane probing system 11 2005
7368927 Probe head having a membrane suspended probe 33 2005
7550983 Membrane probing system with local contact scrub 1 2006
* 2006/0214,676 Membrane probing system with local contact scrub 0 2006
7533462 Method of constructing a membrane probe 2 2006
* 2007/0074,392 Membrane probing system 0 2006
7681312 Membrane probing system 4 2007
7541821 Membrane probing system with local contact scrub 2 2007
* 2007/0296,431 Membrane probing system with local contact scrub 0 2007
7492175 Membrane probing system 5 2008
* 2008/0111,571 Membrane probing system 11 2008
7514944 Probe head having a membrane suspended probe 5 2008
7888957 Probing apparatus with impedance optimized interface 10 2008
7893704 Membrane probing structure with laterally scrubbing contacts 6 2009
8410806 Replaceable coupon for a probing apparatus 5 2009
8451017 Membrane probing method using improved contact 3 2010
9429638 Method of replacing an existing contact of a wafer probing assembly 0 2013
 
WINWAY TECH. CO., LTD. (12)
6633175 Temperature compensated vertical pin probing device 8 2000
6566898 Temperature compensated vertical pin probing device 28 2001
6906540 Method for chemically etching photo-defined micro electrical contacts 15 2001
* 2003/0057,957 Method for chemically etching photo-defined micro electrical contacts 4 2001
6756797 Planarizing interposer for thermal compensation of a probe card 15 2002
6661244 Nickel alloy probe card frame laminate 15 2002
6927586 Temperature compensated vertical pin probing device 62 2003
* 2004/0051,546 Temperature compensated vertical pin probing device 2 2003
6977515 Method for forming photo-defined micro electrical contacts 4 2003
* 2004/0157,350 Method for forming photo-defined micro electrical contacts 1 2003
7282936 Die design with integrated assembly aid 3 2004
* 2005/0110,510 Die design with integrated assembly aid 1 2004
 
SV PROBE PTE LTD. (2)
7180315 Substrate with patterned conductive layer 4 2005
* 2005/0287,789 Substrate with patterned conductive layer 1 2005
 
DELAWARE CAPITAL FORMATION, INC. (1)
* 6414504 Coaxial tilt pin fixture for testing high frequency circuit boards 6 1999
 
THE BOEING COMPANY (1)
* 6690252 RF circuit assembly 0 2001
 
MPI CORPORATION (3)
* 8638116 Probe card having configurable structure for exchanging or swapping electronic components for impedance matching and impedance matching method therefore 0 2011
* 2011/0221,462 PROBE CARD HAVING CONFIGURABLE STRUCTURE FOR EXCHANGING OR SWAPPING ELECTRONIC COMPONENTS FOR IMPEDANCE MATCHING AND IMPEDANCE MATCHING METHOD THEREFORE 0 2011
* 9643271 Method for making support structure for probing device 0 2015
 
Formfactor, et al. (1)
6937037 Probe card assembly for contacting a device with raised contact elements 65 2002
 
Mesatronic S.A. (2)
7425837 Spatial transformer for RF and low current interconnect 0 2006
* 2007/0268,030 Spatial transformer for RF and low current interconnect 1 2006
 
ADVANTEST CORPORATION (3)
* 2004/0051,541 Contact structure with flexible cable and probe contact assembly using same 14 2002
6859054 Probe contact system using flexible printed circuit board 12 2003
* 2005/0035,775 PROBE CONTACT SYSTEM USING FLEXIBLE PRINTED CIRCUIT BOARD 7 2003
 
W. L. GORE & ASSOCIATES, INC. (2)
7015708 Method and apparatus for a high frequency, impedance controlled probing device with flexible ground contacts 95 2003
* 2005/0007,128 Method and apparatus for a high frequency, impedance controlled probing device with flexible ground contacts 2 2003
 
Corad Technology Inc. (1)
* 2008/0048,685 Probe card having vertical probes 5 2006
* Cited By Examiner