Testing and burn-in of IC chips using radio frequency transmission
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United States of America Patent
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Dec 12, 2000
Grant Date -
N/A
app pub date -
Nov 16, 1998
filing date -
Nov 20, 1992
priority date (Note) -
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Abstract
A testing system evaluates one or more integrated circuit chips using RF communication. The system includes an interrogator unit with a radio communication range, and an IC chip adapted with RF circuitry positioned remotely from the interrogator unit, but within the radio communication range. The interrogator unit transmits a power signal to energize the IC chip during test procedures, and interrogating information for evaluating the operation of the IC chip. Test results are transmitted by the IC chip back to the interrogator unit for examination to determine whether the IC chip has a defect. In this manner, one or more IC chips can be evaluated simultaneously without physically contacting each individual chip.
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