Method for manufacturing a semiconductor device

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United States of America Patent

PATENT NO 6171890
SERIAL NO

09421229

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Abstract

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A method for forming a silicon island used for forming a TFT or thin film diode comprises the step of pattering a silicon film with a photoresist mask. In order to prevent the contamination of the semiconductor film due to the photoresist material, a protective film such as silicon oxide is interposed between the semiconductor film and the photoresist film. Also, the protective film is preferably formed by thermal annealing or light annealing in an oxidizing atmosphere.

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Patent Owner(s)

Patent OwnerAddress
SEMICONDUCTOR ENERGY LABORATORY CO LTDJAPAN'S KANAGAWA PREFECTURE ATSUGI CITY ATSUGI-SHI KANAGAWA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Adachi, Hiroki Kanagawa, JP 191 4616
Takemura, Yasuhiko Kanagawa, JP 582 31804
Takenouchi, Akira Kanagawa, JP 23 1297

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