Fast finding algorithm for two-dimensional symbologies
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United States of America Patent
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Jan 16, 2001
Grant Date -
N/A
app pub date -
Apr 16, 1997
filing date -
Apr 16, 1997
priority date (Note) -
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Abstract
A plurality of scan lines is used to detect characteristic features of a checkerboard structure or similar pattern structure of symbology within a field of view. The scan lines cross leading edges of the symbology which provides signals to a plurality of processors. The processors detect instances wherein sequential leading edges exhibit angular shifts corresponding to a pattern of the symbology. A further processor is used to detect when a coincidence of these angular shifts occur, thereby providing an indication of the location of the symbology within the field of view.
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