Electronic probe for measuring high impedance tri-state logic circuits
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United States of America Patent
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-
Jan 16, 2001
Grant Date -
N/A
app pub date -
Oct 30, 1998
filing date -
Oct 30, 1998
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An improved probe for probing high speed, low impedance bus structures. The probe comprises an AC termination portion and an RCR filter. In a first embodiment, the AC termination portion comprises a resistor and capacitor in series. The time constant formed by the AC termination portion is sufficiently larger than the time it takes a signal to travel through the cable of the probe. The RCR filter comprises two resistors in series disposed between the AC termination resistor and ground. A capacitor is connected in parallel to the first resistor in order to achieve a flat pulse response from DC through to high frequencies.
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