High fidelity rotation method and system
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United States of America Patent
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Jan 30, 2001
Grant Date -
N/A
app pub date -
Mar 15, 1999
filing date -
Mar 15, 1999
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method and system for processing first and second seismic traces includes rotating the first seismic traces and the second seismic traces to forty-five degrees in the time domain. In one embodiment, the rotated first time domain traces and second time domain traces are transformed to the frequency domain to obtain an amplitude spectrum for each rotated first time domain trace and an amplitude spectrum for each rotated second time domain trace. Each amplitude spectrum is squared to obtain a power spectrum for each transformed and rotated time domain trace. The phase of each transformed rotated time domain trace to zero. The power spectrum for each transformed rotated time domain trace is then averaged. Each transformed rotated time domain trace is divided into time windows. A power spectrum for each window is obtained for the entire of each transformed rotated time domain trace. The power spectra of each window of the transformed rotated time domain trace is summed to obtain a summed first power spectrum. A third power spectrum representing a source wavelet is defined. The third power spectrum is divided by the power spectrum to obtain a set of frequency domain scalars. The amplitude power spectrum is multiplied by the set of frequency domain scalars. The result of this multiplication is inverse transformed. The amplitudes of the inverse transformed result is compared to derive an first amplitude scalar.
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Patent Owner(s)
| Patent Owner | Address | |
|---|---|---|
| PGS TENSOR INC | SUITE 300 10550 RICHMOND HOUSTON TX 77079 |
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Inventor(s)
| Inventor Name | Address | # of filed Patents | Total Citations |
|---|---|---|---|
| Altan, Suat | Sugarland, TX | 2 | 14 |
| Li, Jianchao | Houston, TX | 12 | 282 |
| Zhu, Xianhuai | Sugarland, TX | 4 | 31 |
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