Method and apparatus for direct access test of embedded memory
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United States of America Patent
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Feb 6, 2001
Grant Date -
N/A
app pub date -
Oct 10, 1997
filing date -
Oct 10, 1997
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An apparatus includes an embedded memory, a plurality of input connectors to receive input signals from an external source, a plurality of output connectors to provide output signals to the external source, and a plurality of reconfigurable input and output signal paths coupled to the embedded memory and the plurality of input and output connectors. When the apparatus is operating in a first operating mode, the plurality of reconfigurable input and output signal paths provide the input signals directly to and the output signals directly from the embedded memory.
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