Semiconductor testing apparatus
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United States of America Patent
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Mar 6, 2001
Grant Date -
N/A
app pub date -
Jun 22, 1998
filing date -
Jun 27, 1997
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An IC testing apparatus which is able to measure the execution time of an automatic function for each DUT by a one-time test, and to grade said automatic function automatically based on the above measured execution time. A IC testing apparatus comprises a evaluation circuit of the automatic function with minimum execution time, a timer which is activated by the above evaluation circuit, and a timer counter which is activated by the above timer and stopped by the evaluation of each DUT, and automatically measures the execution time of automatic function of each DUT.
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