Device for measuring the thickness and/or unevenness of wadding or non-wovens

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United States of America Patent

PATENT NO 6199289
SERIAL NO

09155309

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The invention concerns a device for measuring the thickness and or unevenness of wadding or non-wovens. The device has a guide element (30) for the wadding or non-wovens and a thickness sensor (26, 27, 28) which presses the wadding or non-wovens against the guide element and can move relative to the latter, the position of the sensor providing a measure of the thickness and/or unevenness of the wadding or non-wovens. To achieve a simpler and cheaper design without sacrificing measurement accuracy, an individual sensor is provided with a translation element (31) which converts the deflections of the individual sensor in one direction into a path signal available in another direction. This allows signals corresponding to the deflections of several individual sensors to be added together and applied to a single common path measurement system (32).

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Patent Owner(s)

Patent OwnerAddress
ZELLWEGER LUWA AGUSTER

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Baechler, Francedillaois Uster, CH 5 9

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