Multi-layer reactive sputtering method with reduced stabilization time

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United States of America Patent

PATENT NO 6217720
SERIAL NO

08867789

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Abstract

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A method is described for depositing a complex optical multilayer coating on a substrate. The coating consists of multiple layers of at least two material types. The layers are sequentially deposited in a deposition chamber by reactive deposition; preferably sputtering, and the thickness of the deposited layers is determined one or more times during the layer deposition by taking optical measurements of the deposited layer and fitting theoretical values derived from a model of the deposited layers to the corresponding actual values obtained from said measurements. A process variable is continually controlled to ensure homogeneity of the deposited layers so that a valid thickness determination can be made from said theoretical model.

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Patent Owner(s)

Patent OwnerAddress
NATIONAL RESEARCH COUNCIL OF CANADA1200 MONTREAL ROAD OTTAWA K1A 0R6

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Akiyama, Takayuki Kanagawa, JP 24 50
Clarke, Glenn A Ottawa, CA 5 223
Dobrowolski, Jerzy A Ottawa, CA 14 882
Ito, Takashi Tokyo, JP 587 7807
Sullivan, Brian T Gloucester, CA 37 826

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