Importance

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Abstract

An improved surface characteristic measurement system for measuring a characteristic of a surface comprising a processor, a light source for providing a light beam on the surface to be measured, a position sensing device for sensing a position of a diffused light diffused by the surface, and a photodiode for sensing intensity of a reflected light reflected by the surface. The position sensing device, which may be a PIN diode, provides a position signal to the processor indicative of position of the diffused light while the photodiode provides a reflected light intensity signal to the processor indicative of reflected light intensity. The processor determines the surface characteristic based at least one of the position signal and the reflected light intensity signal. In one embodiment, the position sensing device also provides a diffused light intensity signal to the processor indicative of intensity of the diffused light and the processor determines the surface characteristic based on at least two of these signals. In yet another embodiment, the position sensing device determines the surface characteristic based on all three signals. In other embodiments, the measurement system also includes a second photodiode and a second position sensing device. In alternative embodiments, the photodiode may include a circular sensing area with a centrally positioned opening for allowing passage of the light beam from the light source. Alternatively, the photodiode may have a hemi-spherically shaped sensing area with a centrally positioned opening for allowing passage of the light beam from the light source.

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First Claim