Temperature level detection circuit
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United States of America Patent
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-
May 1, 2001
Grant Date -
N/A
app pub date -
Apr 19, 2000
filing date -
Apr 21, 1999
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
The invention concerns a temperature level detection circuit including means (B1, B2, B3, 11, 12, 21, 31, 32) for generating diode voltages (V.sub.BE1 to V.sub.BE5) and calculating means including capacitive elements (51, 52, 53) and switching means (SW1 to SW4) arranged to connect selectively and sequentially, during first and second phases, the capacitive elements (51, 52, 53) to the means generating said diode voltages (V.sub.BE1 to V.sub.BE5). During the second phase, the calculating means generating a temperature signal representative of the temperature level being greater than or less than a determined temperature threshold (T.sub.limit) defined as the temperature value for which the equation .alpha..sub.1 (V.sub.BE2 -V.sub.BE1)+.alpha..sub.2 (V.sub.BE3 +.alpha..sub.3 (V.sub.BE5 -V.sub.BE4)) becomes zero, where .alpha..sub.1, .alpha..sub.2, and .alpha..sub.3 are first, second and third proportionality coefficients determined by the values of the capacitive elements.
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