Wafer-level package, a method of manufacturing thereof and a method of manufacturing semiconductor devices from such a wafer-level package

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United States of America Patent

PATENT NO 6228684
SERIAL NO

09472824

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Abstract

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A wafer-level package includes a semiconductor wafer having at least one semiconductor chip circuit forming region each including a semiconductor chip circuit each provided with test chip terminals and non test chip terminals, at least one external connection terminal, at least one redistribution trace provided on the semiconductor wafer, at least one testing member, and an insulating material. A first end of the redistribution trace is connected to one of the test chip terminals and a second end of said redistribution trace is extended out to a position offset from the chip terminals. The testing member is provided in an outer region of the semiconductor chip circuit forming region, and the second end of the redistribution trace is connected to the testing member.

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Patent Owner(s)

Patent OwnerAddress
SOCIONEXT INC10-23 SHINYOKOHAMA 2-CHOME KOHOKU-KU YOKOHAMA-SHI KANAGAWA 2220033 ?2220033

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Maruyama, Shigeyuki Kawasaki, JP 73 1167

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