Measuring method by spectrum analyzer

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United States of America Patent

PATENT NO 6229316
SERIAL NO

08707032

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A spectrum analyzer in which automatic setting of parameters such as band width is done by the analyzer without manual operator input and noise measurements are determined and displayed to the operator. This is accomplished by an input signal being supplied to a frequency mixer via an input variable attenuator. The frequency of the input signal is mixed with the frequency of a local signal from a frequency sweep generator. The mixed signal is then supplied to a band pass filter and the output of the filter is amplified by an amplifier. The frequency of the amplified output is mixed with the frequency of a local signal from a local oscillator by a frequency mixer. The intermediate frequency signal is taken out by a band pass filter and the output is detected by a detector. The detected output is converted into a digital signal by an A/D converter after passing through a low pass filter and the digital signal is stored in a buffer memory. A CPU sets an attenuation amount. The CPU also controls a frequency sweep generator by controlling a ramp voltage generator through a timing controller. The CPU sets a sweep frequency band, a band width RBW, a band width VBW, and a sampling period, as well as a display control of the data stored in the buffer memory on a display unit.

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Patent Owner(s)

Patent OwnerAddress
ADVANTEST CORPORATION1-6-2 MARUNOUCHI CHIYODA-KU TOKYO 100-0005

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Aoyama, Osamu Iwaki, JP 4 33
Fukui, Takayoshi Gyoda, JP 12 114
Kasahara, Toshiharu Gyoda, JP 7 63
Kosuge, Takashi Kumagaya, JP 5 49
Miyamae, Yoshiaki Kodama-gun, JP 4 36
Takaoku, Hiroaki Kumagaya, JP 8 49
Yamaguchi, Takahiro Gyoda, JP 464 4091
Yamashita, Kouichi Gyoda, JP 22 209

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