Broadband impedance matching probe
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United States of America Patent
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May 8, 2001
Grant Date -
N/A
app pub date -
May 30, 1997
filing date -
May 30, 1997
priority date (Note) -
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Abstract
A probe for testing integrated circuits at microwave frequencies employs a tapered coaxial transmission line to transform the impedance at the probe tips to the impedance of the test instruments. Mechanically resilient probe tip structures allow reliable probing of non-planar circuits and the elastic probe body allows large overprobing without damage to the test circuit. Novel insulator structures for the coaxial line allow easy and accurate assembly and high performance.
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