Infrared imaging of ultrasonically excited subsurface defects in materials

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United States of America Patent

PATENT NO 6236049
SERIAL NO

09397585

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A thermal imaging system for detecting cracks and defects in a component. An ultrasonic transducer is coupled to the specimen through a malleable coupler. Ultrasonic energy from the transducer causes the defects to heat up, which is detected by a thermal camera. The ultrasonic energy is in the form of a pulse where the frequency of the ultrasonic signal is substantially constant within the pulse. A control unit is employed to provide timing and control for the operation of the ultrasonic transducer and the camera.

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Patent Owner(s)

  • SIEMENS ENERGY, INC.;WAYNE STATE UNIVERSITY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Favro, Lawrence D Huntington Woods, MI 18 552
Han, Xiaoyan Plymouth, MI 25 320
Ouyang, Zhong Detroit, MI 23 199
Sui, Hua Detroit, MI 4 129
Sun, Gang Dearborn Heights, MI 112 1742
Thomas, Robert L Huntington Woods, MI 24 590

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