Method and apparatus for wireless radio frequency testing of RFID integrated circuits
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United States of America Patent
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May 22, 2001
Grant Date -
N/A
app pub date -
Feb 10, 1999
filing date -
Nov 9, 1998
priority date (Note) -
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Abstract
A method and apparatus for wireless radio frequency (RF) testing of radio frequency identification integrated circuits (RFID IC) is disclosed. A fixture is provided for physically and electrically contacting the RFID IC to feed an RF interrogating signal into the RFID IC and receive an RF return signal generated in response thereto. The fixture is coupled to a tester via first and second couplers (interconnected to the fixture and tester, respectively) which establish a wireless link for transmitting and receiving the RF interrogation signal and the RF return signal thereby allowing full and accurate RF characterization of the RFID IC.
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