System and method for automatically creating and transmitting test conditions of integrated circuit devices
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United States of America Patent
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May 22, 2001
Grant Date -
N/A
app pub date -
Jun 30, 1998
filing date -
Jun 30, 1997
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
Production information for ASIC (Application Specific Integrated Circuit) devices is stored in a database of a remote host system, and data necessary for a test program which controls testers for testing the IC devices are automatically created and transmitted to a tester host. This automatic system collects the data necessary for the test condition from the remote host database; creates the test condition by comparing the collected data with a predetermined handling condition; transmits the test condition to a tester host which controls a plurality of testers using corresponding test programs; and loads the test condition into the corresponding test program. This system avoids human errors which often result when test engineers write test conditions manually, and also allows quick response to a situation when new specific IC devices are required by a customer.
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