Probe needle for vertical needle type probe card and fabrication thereof
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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-
Jun 5, 2001
Grant Date -
N/A
app pub date -
Apr 16, 1998
filing date -
Nov 10, 1997
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A probe needle for a vertical needle type probe card is obtained that allows testing of electrical characteristics to be carried at high accuracy and that has high durability to reduce exchange work and cost. The configuration of a probe needle is formed to have a first bending portion bent towards a first lateral direction and a second bending portion bent towards a second lateral direction opposite to the first lateral direction at substantially 180.degree. thereto. The stress exerted on the probe needle can be absorbed by the two bending portions at the left and right side. The deviation in the axis direction of the leading end of the probe needle can be reduced. Also, folding and bending of the probe needle can be prevented.
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