Monitoring and control apparatus incorporating run-time fault detection by boundary scan logic testing

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United States of America Patent

PATENT NO 6243665
SERIAL NO

08894630

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Abstract

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The monitoring control apparatus according to the present invention performs a test on each integrated circuit that supports the boundary scan test method loaded on CPU board 4 and control board 5, and on the connection relationships of these integrated circuits, by a boundary scan controller board 7 like that shown, for example, in FIG. 1. If an abnormality is detected in CPU board 4 or control board 5, an alarm apparatus 9 is activated which emits an alarm. Moreover, if the type of abnormality is such that there is the risk of it having a significant effect on the operation of a robot 3, which is the target of this monitoring and control, from the viewpoint of safety, main power supply apparatus 6 of robot 3 is interrupted to prevent in advance robot 3 from running out of control.

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Patent Owner(s)

Patent OwnerAddress
DUAXES CORPORATION3-2-5 KASUMIGASEKI CHIYODA-KU TOKYO 100-6014

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nagoya, Mitsugu Tokyo, JP 30 434
Sakamaki, Kazumi Fujimi, JP 3 152

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