Semiconductor integrated circuit capable of testing and substituting defective memories and method thereof
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United States of America Patent
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Jun 12, 2001
Grant Date -
N/A
app pub date -
Nov 6, 2000
filing date -
Jun 30, 2000
priority date (Note) -
Expired
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Abstract
A semiconductor integrated circuit comprises many RAMs, a supplementary RAM, and test/repair control logic which detects a defective RAM out of the multiple RAMs. If a defective RAM is detected, selectors supplement such a defective RAM with the supplementary RAM.
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