Low cost thickness measurement method and apparatus for thin coatings
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United States of America Patent
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Jun 26, 2001
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N/A
app pub date -
Jul 15, 1998
filing date -
Jul 15, 1998
priority date (Note) -
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Abstract
A method and apparatus for measuring the thickness of a coating on a coated surface. The method uses a solid state array of light-sensitive elements to measure light emitted from a fluorescing coating composition. The intensity of the emitted light corresponds to the thickness of the coating composition, and provides a fast and accurate measure of coating thickness.
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