US Patent No: 6,255,835
Number of patents in Portfolio can not be more than 2000
Circuit for testing option of a semiconductor memory device
Stats
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Jul 3, 2001
Issued date -
Jun 29, 1999
filing date -
09/342,179
serial no -
In Force
status
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Abstract
There is disclosed an option function test apparatus of a semiconductor device including a function selecting means. The function selection means includes a fuse signal detecting section for sensing the state of fuse blowing, a pad signal detecting section for sensing the signal state on the probe pad for selecting its specification, which is consisted by incorporating extra probe chips into the existing probe card, and a global signal control section for receiving the output signals from said fuse signal detecting section and said pad signal detecting section to output different output signals based on its operation mode. Thus, the present invention can provide an outstanding effect of reducing additional test time and cost depending on the changes in function, since it allows a multifunction test of all of the specifications mounted on the on-chip in a wafer state.
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First Claim
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International Classification(s)
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Cited Art
| Patent Info | (Count) | # Cites | Year |
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| 5,257,225 Method for programming programmable devices by utilizing single or multiple pulses varying in pulse width and amplitude | 78 | 1992 | |
| 5,301,143 Method for identifying a semiconductor die using an IC with programmable links | 116 | 1992 | |
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| 5,311,476 Semiconductor memory, components and layout arrangements thereof, and method of testing the memory | 22 | 1992 | |
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| 4,743,841 Semiconductor integrated circuit including circuit elements evaluating the same and having means for testing the circuit elements | 97 | 1986 | |
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| 5,774,404 Semiconductor memory having self-refresh function | 26 | 1995 | |
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| 5,345,413 Default fuse condition for memory device after final test | 23 | 1993 | |
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| 5,361,003 Adjustable buffer driver | 25 | 1993 | |
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| 5,659,510 Integrated circuit devices with reliable fuse-based mode selection capability and methods of operating same | 4 | 1996 | |
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| 5,402,390 Fuse selectable timing signals for internal signal generators | 30 | 1993 | |
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| 4,398,146 Test circuit for MOS devices | 43 | 1980 | |
Patent Citation Ranking
Maintenance Fees
| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|---|---|---|---|
| 11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Jan 3, 2013 |
| Fee | Large entity fee | small entity fee | micro entity fee |
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| Surcharge - 11.5 year - Late payment within 6 months | $160.00 | $80.00 | $40.00 |
| Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
| Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |