Methods and system for measuring three dimensional spatial coordinates and for external camera calibration necessary for that measurement

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United States of America Patent

PATENT NO 6256099
SERIAL NO

09426319

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Abstract

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The present invention relates to methods and system for measuring three dimensional spatial coordinates and for external camera calibration necessary for that measurement. A simple pattern of light is projected onto a surface and used as a photogrammetric target. Images of the simple pattern are captured by two or more cameras, and processed by a computer provided with software using conventional algorithms to identify homologous points. Either, these points are used to calculate the external calibration of the cameras, or they are used in conjunction with previously calculated external camera calibration in order to calculate three dimensional spatial coordinates on the surface of an object to be measured.

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Patent Owner(s)

Patent OwnerAddressTotal Patents
INDUSTRIAL METRICS INC., THENORTH VANCOUVER BC, CA0

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chow, Jeffrey Brian 230 E 56th Ave, Vancouver, B.C., CA 1 17
James, Robert Newton 2060 Bellwood, Burnaby, B.C., CA 1 17
Kaufman, Frederick 1937 Pendrell Str., Suite 403, Vancouver, B.C., CA 1 17
Lang, Curtis Earle late of North Vancouver, CA 1 17

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