Methods and system for measuring three dimensional spatial coordinates and for external camera calibration necessary for that measurement
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United States of America Patent
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Jul 3, 2001
Grant Date -
N/A
app pub date -
Oct 25, 1999
filing date -
Nov 6, 1998
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
The present invention relates to methods and system for measuring three dimensional spatial coordinates and for external camera calibration necessary for that measurement. A simple pattern of light is projected onto a surface and used as a photogrammetric target. Images of the simple pattern are captured by two or more cameras, and processed by a computer provided with software using conventional algorithms to identify homologous points. Either, these points are used to calculate the external calibration of the cameras, or they are used in conjunction with previously calculated external camera calibration in order to calculate three dimensional spatial coordinates on the surface of an object to be measured.
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