US Patent No: 6,256,099

Number of patents in Portfolio can not be more than 2000

Methods and system for measuring three dimensional spatial coordinates and for external camera calibration necessary for that measurement

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Abstract

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The present invention relates to methods and system for measuring three dimensional spatial coordinates and for external camera calibration necessary for that measurement. A simple pattern of light is projected onto a surface and used as a photogrammetric target. Images of the simple pattern are captured by two or more cameras, and processed by a computer provided with software using conventional algorithms to identify homologous points. Either, these points are used to calculate the external calibration of the cameras, or they are used in conjunction with previously calculated external camera calibration in order to calculate three dimensional spatial coordinates on the surface of an object to be measured.

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Patent Owner(s)

Patent OwnerAddressTotal Patents
INDUSTRIAL METRICS INC., THENORTH VANCOUVER BC, CA1

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chow, Jeffrey Brian 230 E 56th Ave, Vancouver, B.C., CA 1 11
James, Robert Newton 2060 Bellwood, Burnaby, B.C., CA 1 11
Kaufman, Frederick 1937 Pendrell Str., Suite 403, Vancouver, B.C., CA 1 11
Lang, Curtis Earle late of North Vancouver, CA 1 11

Cited Art Landscape

Patent Info (Count) # Cites Year
 
GENERAL ELECTRIC COMPANY (1)
5,589,942 Real time three dimensional sensing system 46 1990
 
LAWRENCE LIVERMORE NATIONAL SECURITY, LLC (1)
5,852,672 Image system for three dimensional, 360 DEGREE, time sequence surface mapping of moving objects 107 1997
 
Mechanical Technology Incorporated (1)
5,193,120 Machine vision three dimensional profiling system 67 1991
 
Other [Check patent profile for assignment information] (1)
5,886,767 Keratometry system and method for measuring physical parameters of the cornea 32 1996

Patent Citation Ranking

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Patent Info (Count) # Cites Year
 
RENISHAW PLC (3)
8,805,055 Non-contact measurement apparatus and method 0 2008
8,792,707 Phase analysis measurement apparatus and method 0 2008
8,605,983 Non-contact probe 0 2008
 
GEODETIC SERVICES, INC. (1)
6,826,299 Photogrammetric image correlation and measurement system and method 10 2001
 
ISRA VISION AG (1)
7,602,507 Sensor for measuring the surface of an object 2 2005
 
MAPVISION OY LTD. (1)
7,324,712 Quality factor 0 2002
 
MINOLTA CO., LTD. (1)
6,853,458 Three-dimensional measuring method and device, and computer program 10 2002
 
STRIDER LABS, INC. (1)
7,103,212 Acquisition of three-dimensional images by an active stereo technique using locally unique patterns 28 2003
 
THE OHIO WILLOW WOOD COMPANY (1)
7,447,558 Apparatus for determining a three dimensional shape of an object 9 2005
 
XSENSE TECHNOLOGY CORP. (1)
6,922,207 3-dimension scanning method and 3-dimension scanning system using the same 0 2004
 
Other [Check patent profile for assignment information] (1)
7,463,280 Digital 3D/360 degree camera system 7 2003