System for evaluating and reporting semiconductor test processes
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United States of America Patent
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Jul 3, 2001
Issued Date -
N/A
app pub date -
Feb 24, 2000
filing date -
Sep 26, 1997
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Abstract
A system is disclosed for evaluating relevant data across independent test sequences and providing a consumable output to give a tester an accurate account of the test data. A method for reporting the results of the test processes includes several steps. First, repair, trending, characterization, timing and engineering data for two separate test sequences are read. Next, the data is compared. Also, an analytical report of the test data comparisons is assembled and output.
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