IC testing apparatus
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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Jul 10, 2001
Grant Date -
N/A
app pub date -
Jul 21, 1999
filing date -
Jul 24, 1998
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An IC testing apparatus 1 for performing a test by applying at least a low temperature stress to ICs to be tested comprising a refrigerant cycle 210 wherein at least a compressor 211, condenser 212, expansion valve 214 and evaporator 215 are connected in this order, and a cold air applying line 220 having a blower 223 for supplying heat exchanged cold air by the evaporator 215 to the ICs to be tested.
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