Probe for measuring signals
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Aug 7, 2001
Grant Date -
N/A
app pub date -
Mar 27, 1999
filing date -
Mar 31, 1998
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A probe for measuring signals with a narrow contact pitch comprises an end section having a main tip member and a sub-tip member, each of which passes through one of two holes in a housing. The sub-tip member is electrically connected to the housing and the main-tip member is insulated from the housing by an insulation member. The sub-tip member is pivotally connected to the housing. The subtip member is asymmetric with respect to the pivot and therefore, its sharpened end can trace a circular orbit when the sub-tip member turns on its pivot. The distance between the two end sections of these tip members (that is, the contact pitch) can be set to a desired length by positioning sub-tip sharpened end section to any point on this orbit.
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