Testing method for a substrate of active matrix display panel
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Aug 14, 2001
Grant Date -
N/A
app pub date -
Sep 24, 1999
filing date -
Sep 25, 1998
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
In the substrate test method of, a first test circuit is connected to an array substrate, and a signal for turning on all the thin film transistors arranged on the array substrate is supplied to a scanning line driving circuit. Also, a predetermined voltage is applied to a signal line driving circuit through signal lines so as to supply a predetermined voltage to a storage capacitor electrode. Under this condition, a high voltage sufficient for forming a potential difference higher than that in the stage of forming a storage capacitor is applied to the storage capacitor line.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully