System and method for measuring object features with coordinated two and three dimensional imaging
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United States of America Patent
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Sep 18, 2001
Grant Date -
N/A
app pub date -
Jun 8, 1999
filing date -
Jun 8, 1999
priority date (Note) -
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Abstract
A system and method are disclosed for highly efficient imaging of selected object features utilizing, in combination, a 2D imaging subsystem and a 3D imaging subsystem wherein data from the 2D imaging subsystem is used to predetermine areas containing 3D features of interest such that delay attributable to imaging of areas of non-interest for 3D features is minimized.
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