Electrical inspection device for detecting a latent defect
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United States of America Patent
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-
Oct 9, 2001
Grant Date -
N/A
app pub date -
Nov 23, 1998
filing date -
Nov 28, 1997
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An electric inspection device impresses between a pair of terminals a current pulse train having a constant pitch, a constant pulse width and a constant current, and measures the resistance appearing between the terminals based on the voltage appearing between the terminals. The variation of the resistance measured for the current pulses is compared against a threshold. If there is any latent defect in the circuit, such as latent open-circuit or short-circuit failure resides which is not in effect at present, a large variation of resistance is observed.
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