Scattering parameter calibration system and method

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United States of America Patent

PATENT NO 6300775
SERIAL NO

09241704

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Abstract

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A system and method of calibrating an S parameter measurement instrument (such as a vector network analyzer) in which the number of calibrations required to fully characterize the error model of an n-port system is n/2 calibrations for an even number of ports and (n+1)/2 calibrations for an odd number of ports. Each test port in the system is involved in at least one full calibration, thus n/2 test paths are fully calibrated. For each measured test path, the error terms of the applicable error model are calculated. These error terms are then decoupled from the associated test path into error parameters that are localized to the individual test ports of the test path. Having localized the error parameters, the error model for each test port can then be treated independently from the other test ports. The error terms for the test paths that are not calibrated are then constructed using the localized error parameters for the individual test ports.

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Patent Owner(s)

Patent OwnerAddress
KEYSIGHT TECHNOLOGIES INC1400 FOUNTAINGROVE PARKWAY SANTA ROSA CA 95403

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Peach, Robert Cambridge, CA 27 580
Svensson, Nicholas Kitchener, CA 3 157
Vo, Thai Kitchener, CA 1 133

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