Antifuse method to repair columns in a prefetched output memory architecture
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United States of America Patent
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Oct 9, 2001
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N/A
app pub date -
Aug 25, 2000
filing date -
Aug 25, 2000
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Abstract
A memory device having a first set of programmable elements programmed to store an address of a column having a bad memory cell, and a second set of programmable elements programmed to store a segment-in-time (SIT) of the bad memory cell, the SIT of the bad memory cell indicating a relative position of the bad memory cell within a plurality of memory cells being accessed in a memory access. The SIT allows the memory device to selectively repair a bad memory cell within a column of memory cells accessed during a memory operation.
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