Method of manufacturing dummy pattern

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United States of America Patent

PATENT NO 6303484
SERIAL NO

09482138

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Abstract

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A method of fabricating a dummy pattern is proposed. A semiconductor substrate is divided into a dense region and a sparse region. Conducting patterns are formed on the dense region. A dielectric layer is formed over the substrate and the conducting patterns. Photoresist patterns are formed on the dielectric layer above the sparse region. The dielectric layer is etched back to form a plurality of spacers on the sidewall of the conducting patterns, and simultaneously, a plurality of dummy patterns are formed on the sparse region.

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Patent Owner(s)

Patent OwnerAddress
UNITED MICROELECTRONICS CORPHSIN-CHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Wei-Shiau Chin-Men Hsien, TW 9 27

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