Method for determining an examination point for the diaphanoscopic examination of a being and device for realizing the same

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United States of America Patent

PATENT NO 6311083
SERIAL NO

09463151

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Abstract

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In a method and an apparatus for locating an examination size for diaphanoscopic examination of a living subject, a region of the living subject wherein the optimum examination location is suspected is sequentially transilluminated with radiation, preferably in a wavelength range of the optical tissue window, for registration of scattered light distributions in the form of location-related spread functions, particularly point spread functions, and at least one function-specific, location-related feature of each spread function is determined, based on which a position value defining the examination location is determined.

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Patent Owner(s)

Patent OwnerAddress
SIEMENS AKTIENGESELLSCHAFTWERNER-VON-SIEMENS-STRASSE 1 MÜNCHEN 80333

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Abraham-Fuchs, Klaus Erlangen, DE 99 1765
Beuthan, Juergen Berlin, DE 4 30
Mueller, Gerhard-J Berlin, DE 1 10
Prapavat, Viravuth Hamburg, DE 1 10

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