Device and method for isolating a short-circuited integrated circuit (IC) from other IC's on a semiconductor wafer
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United States of America Patent
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Nov 6, 2001
Grant Date -
N/A
app pub date -
May 22, 1998
filing date -
May 22, 1998
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A circuit for isolating a short-circuited integrated circuit (IC) formed on the surface of a semiconductor wafer from other ICs formed on the wafer that are interconnected with the short-circuited IC includes control circuitry within the short-circuited IC for sensing the short circuit. The control circuitry may sense the short circuit in a variety of ways, including sensing excessive current drawn by the short-circuited IC, and sensing an abnormally low or high voltage within the short-circuited IC. Switching circuitry also within the short-circuited IC selectively isolates the short-circuited IC from the other ICs on the wafer in response to the control circuitry sensing the short circuit. As a result, if the wafer is under probe test, for example, testing can continue uninterrupted on the other ICs while the short-circuited IC is isolated.
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