Probe for fault actuation devices
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United States of America Patent
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-
Nov 20, 2001
Grant Date -
N/A
app pub date -
Aug 7, 1998
filing date -
Mar 6, 1996
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A probe for fault-actuation devices has a transistor which is utilized to insert a reference signal into a fault-insertion point. The emitter and collector are connectable to the fault-insertion point and a reference signal and a capacitor with a capacitance greater than the capacitance of parasitic components is connected between the base and the emitter.
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