Method for analysis and display of transient process events using Kohonen map
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United States of America Patent
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Nov 20, 2001
Grant Date -
N/A
app pub date -
Dec 2, 1997
filing date -
Dec 2, 1996
priority date (Note) -
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Abstract
A method for analyzing and displaying process states of a technical plant includes enabling simultaneous, coherent assessment and display of relevant process variables of the plant by evaluating relevant process variables with regard to one another through the use of a neural analysis on the basis of self-organizing maps, by making a topology-producing projection of data of the relevant process variables onto a neural map. The current process courses are plotted as trajectories on the map. Evaluation in the sense of a diagnosis can be carried out either visually or in an automated manner.
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