US Patent No: 6,326,230

Number of patents in Portfolio can not be more than 2000

High speed CMOS imager with motion artifact supression and anti-blooming

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Abstract

An image sensor includes pixels formed on a semiconductor substrate. Each pixel includes a photoactive region in the semiconductor substrate, a sense node, and a power supply node. A first electrode is disposed near a surface of the semiconductor substrate. A bias signal on the first electrode sets a potential in a region of the semiconductor substrate between the photoactive region and the sense node. A second electrode is disposed near the surface of the semiconductor substrate. A bias signal on the second electrode sets a potential in a region of the semiconductor substrate between the photoactive region and the power supply node. The image sensor includes a controller that causes bias signals to be provided to the electrodes so that photocharges generated in the photoactive region are accumulated in the photoactive region during a pixel integration period, the accumulated photocharges are transferred to the sense node during a charge transfer period, and photocharges generated in the photoactive region are transferred to the power supply node during a third period without passing through the sense node. The imager can operate at high shutter speeds with simultaneous integration of pixels in the array. High quality images can be produced free from motion artifacts. High quantum efficiency, good blooming control, low dark current, low noise and low image lag can be obtained.

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First Claim

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Patent Owner(s)

Patent OwnerAddressTotal Patents
CALIFORNIA INSTITUTE OF TECHNOLOGYPASADENA, CA2499

International Classification(s)

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  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Pain, Bedabrata Los Angeles, CA 61 1218
Wrigley, Chris La Crescenta, CA 2 54
Yadid-Pecht, Orly Arcadia, CA 31 332
Yang, Guang Beijing, CN 132 410

Cited Art

Patent Info (Count) # Cites Year
 
CALIFORNIA INSTITUTE OF TECHNOLOGY (2)
5,471,515 Active pixel sensor with intra-pixel charge transfer 550 1994
5,909,026 Integrated sensor with frame memory and programmable resolution for light adaptive imaging 84 1997
 
AGERE SYSTEMS INC. (1)
5,835,141 Single-polysilicon CMOS active pixel image sensor 52 1996
 
ROUND ROCK RESEARCH, LLC (1)
6,147,846 Drive circuit with over-voltage protection for use with pixel cells and other circuits 16 1998
 
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (1)
5,854,100 Method of forming a new bipolar/CMOS pixel for high resolution imagers 25 1997

Patent Citation Ranking

Forward Cites

Patent Info (Count) # Cites Year
 
APTINA IMAGING CORPORATION (5)
6,859,227 Active pixel sensor with reduced fixed pattern noise 5 2000
6,624,456 Frame shutter pixel with an isolated storage node 8 2001
7,525,582 Active pixel sensor with reduced fixed pattern noise using two active regions 0 2005
7,687,302 Frame shutter pixel with an isolated storage node 0 2008
7,973,843 Active pixel sensor with reduced fixed pattern noise 0 2009
 
NIKON CORPORATION (5)
8,013,927 Solid-state image sensors 0 2006
8,013,921 Solid-state imaging device, electronic camera 1 2008
8,174,088 Solid state imaging device 0 2010
8,134,622 Imaging device 1 2010
8,269,870 Imaging device for suppressing variations in electric potentials 0 2010
 
HAND HELD PRODUCTS, INC. (3)
7,492,493 Bar code reading device having plurality of operating states 3 2007
8,146,817 Reading apparatus having partial frame operating mode 0 2008
7,817,878 Imaging apparatus having plurality of operating states 2 2009
 
MICRON TECHNOLOGY, INC. (3)
7,187,049 Data download to imager chip using image sensor as a receptor 1 2002
7,388,239 Frame shutter pixel with an isolated storage node 2 2003
7,390,690 Imager light shield 7 2004
 
SAMSUNG ELECTRONICS CO., LTD. (3)
6,963,092 Image sensors including photodetector and bypass device connected to a power supply voltage 2 2003
7,026,185 Methods of fabricating image sensors including local interconnections 1 2005
7,186,583 Methods of fabricating image sensors including local interconnections 0 2006
 
TELEDYNE DALSA, INC. (3)
6,713,796 Isolated photodiode 23 2002
6,566,697 Pinned photodiode five transistor pixel 23 2002
7,045,753 Five transistor CMOS pixel 7 2003
 
YOULIZA, GEHTS B.V. LIMITED LIABILITY COMPANY (3)
7,253,461 Snapshot CMOS image sensor with high shutter rejection ratio 10 2005
7,423,302 Pinned photodiode (PPD) pixel with high shutter rejection ratio for snapshot operating CMOS sensor 0 2005
7,833,814 Method of forming pinned photodiode (PPD) pixel with high shutter rejection ratio for snapshot operating CMOS sensor 0 2008
 
CANON KABUSHIKI KAISHA (2)
7,456,888 Photoelectric conversion device and image pick-up system using the photoelectric conversion device 3 2003
8,085,330 Image pickup apparatus 0 2009
 
DIGITAL IMAGING SYSTEMS GMBH (2)
7,847,821 On chip test mode implementation 2 2006
8,363,042 Photon transfer curve test time reduction 0 2007
 
OMNIVISION TECHNOLOGIES, INC. (2)
7,791,663 Image sensor and pixel that has positive transfer gate voltage during integration period 1 2004
7,956,913 Image sensor and pixel that has positive transfer gate voltage during integration period 0 2010
 
DALSA CORPORATION (1)
6,847,070 Five transistor CMOS pixel 11 2003
 
E2V TECHNOLOGIES LIMITED (1)
7,498,584 Radiation sensor 1 2006
 
KABUSHIKI KAISHA TOSHIBA (1)
6,784,933 Solid-state imaging device and method for controlling same 7 2000
 
KAWASAKI MICROELECTRONICS, INC. (1)
6,933,973 CMOS image sensor having block scanning capability 10 2000
 
KONINKLIJKE PHILIPS ELECTRONICS N.V. (1)
7,346,146 X-ray detector with photo-gates and dose control 0 2005
 
NEC ELECTRONICS CORPORATION (1)
7,218,346 Method for driving solid-state image pickup device 2 1999
 
VIA TECHNOLOGIES, INC. (1)
7,714,921 Operating method of image-sensing unit and image-sensing device using the same 0 2005
 
OTHER [CHECK PATENT PROFILE FOR ASSIGNMENT INFORMATION] (1)
8,439,264 Reading apparatus having partial frame operating mode 0 2008

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