Method and system for embedded chip erase verification

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United States of America Patent

PATENT NO 6331951
SERIAL NO

09717550

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Abstract

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A method and system are disclosed for verifying memory cell erasure, which may be employed in association with a dual bit memory cell architecture. The method includes selectively verifying proper erasure of one of a first bit of the cell and a second bit of the cell, determining that the dual bit memory cell is properly erased if the first and second bits of the cell are properly erased, and selectively erasing at least one of the first and second bits of the cell if one of the first and second bits is not properly erased. The method may also comprise selectively re-verifying proper erasure of one of the first and second bits after selectively erasing at least one of the first and second bits.

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Patent Owner(s)

Patent OwnerAddress
LONGITUDE FLASH MEMORY SOLUTIONS LTDSANDYFORD DUBLIN D18 P3Y9

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bautista, Jr Edward V Santa Clara, CA 18 338
Chen, Pau-Ling Saratoga, CA 73 2348
Hamilton, Darlene G San Jose, CA 34 1118
Lee, Weng Fook Penang, MY 14 226
Wong, Keith H San Jose, CA 2 105

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