Baseplate for chip burn-in and/of testing, and method thereof
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United States of America Patent
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Jan 1, 2002
Grant Date -
N/A
app pub date -
Dec 17, 1999
filing date -
Dec 17, 1999
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The present invention relates generally to a new structure and method for chip burn-in and/or testing. More particularly, the invention encompasses a baseplate that is secured to a delicate chip and a method for such an invention is also disclosed. The inventive baseplate provides an added strength to a complex chip while it is being tested and/or burned-in, and then during normal use the baseplate of this invention is an integrated component of the chip.
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