SOI array sense and write margin qualification
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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Jan 22, 2002
Grant Date -
Jan 10, 2002
app pub date -
Jun 1, 2001
filing date -
Jul 6, 2000
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The present invention relates to storage devices and in particular, it relates to a method for testing the storage quality of history dependent memory array cells. A cell can be stressed selectively with predetermined test conditions such that these test conditions cover all of the hardware status distribution which might arise when the cell is operated under the full range of operating conditions. This is basically achieved by cutting off a predetermined cutoff width of the trailing edge of the active wordline select pulse.
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