Situ dielectric stacks

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United States of America Patent

PATENT NO 6348420
SERIAL NO

09471761

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Abstract

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Multiple sequential processes are conducted in situ in a single-wafer processing chamber, particularly for forming ultrathin dielectric stacks of high quality. The chamber exhibits single-pass, laminar gas flow, facilitating safe and clean sequential processing. Furthermore, a remote plasma source widens process windows, permitting isothermal sequential processing and thereby reducing the transition time for temperature ramping between in situ steps. In exemplary processes, extremely thin interfacial silicon oxide, nitride and/or oxynitride is grown, followed by in situ silicon nitride deposition. Cleaning, anneal and electrode deposition can also be conducted in situ, reducing transition time without commensurate loss in reaction rates.

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Patent Owner(s)

Patent OwnerAddress
ASM AMERICA INC3440 EAST UNIVERSITY DRIVE PHOENIX AS 85034

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Raaijmakers, Ivo Bilthoven, NE 113 13612
Werkhoven, Chris Tempe, AZ 5 170

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