Automatic generation of one dimensional data compaction commands for electron beam lithography

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United States of America Patent

PATENT NO 6353922
SERIAL NO

09382107

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Abstract

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A method, and a system for employing the method, for compacting the amount of memory required to store a two dimensional array of exposure spot shapes in a numerically controlled (NC) electron beam lithography tool. The method includes the steps of: sorting the shapes in a selected line based on the widths and heights of the shapes; identifying and removing from contention a group of shapes in the selected line having common widths and heights; determining a dosage requirement for the shapes in the group; and applying one or more commands based on the group and the determined dosed requirement to enable the NC electron beam lithography tool to draw the two dimensional array of exposure spot shapes. Before the sorting step, the method can include initially selecting whether processing for the shapes is performed on a vertical line or on a horizontal line basis; and applying the sorting step, the identifying step, the determining step and the applying step on a basis not selected in the initially selecting step. The method can also include the steps of: preselecting a minimum number of required common shapes; and performing the identifying and removing step only if the number of shapes in the group equals or exceeds the minimum number.

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Patent Owner(s)

Patent OwnerAddress
INTERNATIONAL BUSINESS MACHINES CORPORATIONNEW ORCHARD ROAD ARMONK NY 10504

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dick, Gregory J Beacon, NY 9 68

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