Nonvolatile memory structures and fabrication methods

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United States of America Patent

PATENT NO 6355524
SERIAL NO

09640139

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Abstract

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In a nonvolatile memory, select gates are self-aligned spacers formed on sidewalls of floating/control gate stacks. The same mask (1710) is used to remove the select gate layer from over the source lines (144), to etch trench insulation in the source line regions, and to dope the source lines. The memory can be formed in and over an isolated substrate region. The source lines can be doped at least partially before the trench insulation is etched, to prevent a short before the source lines and a region isolating the isolated substrate region from below. The memory can be erased by sectors, or alternatively a chip erase operation can be performed to erase all the cells in parallel. Peripheral transistor gates can be formed from the same layer as the select gates. The select gate spacers have extensions to which low resistance contacts can be made from overlying metal lines.

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Patent Owner(s)

Patent OwnerAddress
PROMOS TECHNOLOGIES INCA3 3F NO 1 LI HSIN 1ST RD HSINCHU SCIENCE PARK HSINCHU 30078

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chang, Thomas Tong-Long Santa Clara, CA 4 135
Leung, Chung Wai Milpitas, CA 24 309
Li, Li-Chun Los Gatos, CA 37 486
Tuan, Hsing Ti Cupertino, CA 6 131

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