Apparatus and method for measurement of mass and heat flow changes
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United States of America Patent
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Apr 16, 2002
Grant Date -
Jul 19, 2001
app pub date -
Feb 16, 2001
filing date -
Dec 2, 1997
priority date (Note) -
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Abstract
Provided are a measurement apparatus and a measurement system comprising sample and reference microresonators, such as sample and reference quartz crystal microbalances; sample and reference heat flow sensors; and a heat sink coupled thermally to the heat flow sensors. These may be used to measure changes in one or more properties, such as mass, due to a liquid sample on a surface of a sample microresonator and also to measure heat flows from the sample on the surface of the sample microresonator by utilizing the heat flow sensors, which are coupled thermally to the corresponding sample or reference microresonators. Also provided is a method for measuring one or more properties, such as mass, of a liquid sample and the flow of heat from the sample to the heat sink by utilizing such apparatus.
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