Method and apparatus to detect a flaw in a surface of an article
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United States of America Patent
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Apr 16, 2002
Issued Date -
N/A
app pub date -
May 27, 1999
filing date -
May 27, 1999
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An inspection apparatus includes a laser system. The laser system has a high reflector and an output coupler that define an oscillator cavity which produces an output beam. A gain medium and a mode locking device are positioned in the oscillator cavity. A diode pump source produces a pump beam that is incident on the gain medium. An output beam directing apparatus directs the output beam to the surface of the article. A surface flaw at the surface of the article produces scattered light from at least a portion of the output beam incident on the surface flaw. A detector is positioned to detect the scattered light.
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