Importance

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Abstract

A technique is provided for use in testing replicated components (e.g., identical circuit components) of an electronic device for defects. In one aspect of this testing technique, the same test inputs may be broadcast, in parallel, from a single test interface to each of the replicated components of the electronic device under test. Respective test outputs generated by the replicated components in response to the test inputs may be supplied to a comparator, comprised in the electronic device, that compares the respective test outputs to each other and generates a fault signal if corresponding test outputs are not identical. This fault signal may be supplied to an external test interface pin of the single test interface, and its assertion may indicate that one or more of the replicated components may be defective. The respective test outputs may be multiplexed to permit output via an external interface of respective test outputs from a selected component. These respective test outputs may be compared to expected values therefor whereby to determine presence and/or nature of defects in the replicated components.

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First Claim